大拱桥--暨南大学学生门户 » 图书馆 » 搜索包含 United States. Advisory Group on Electron Devices 的图书(共1969本)

Recent advances in parallel virtual machine and message passing interface : 6th European PVM/MPI User's Group Meeting, Barcelona, Spain, September 26-29, 1999 : proceedings

0
索取号：TP338.6-532/E991/6
作者：European PVM/MPI User's Group Meeting (6th : 1999 : Barcelona、 Spain)、Dongarra、 J. J.、Luque、 E.、Margalef、 Tom as.、
出版社：New York : Springer-Verlag, 2000.

Electron energy loss spectroscopy and surface vibrations

0
索取号：TN01/E901
作者：Ibach、 H.、 1941-、Mills、 D. L.、
出版社：New York : Academic Press, 1982.

Circuits, signals, and devices

0
索取号：TN01/E902
作者：Julian、 Michael、 1935-、
出版社：Harlow, Essex, England : Longman Scientific & Technical ; New York : Wiley, 1988.

Rational fault analysis

0
索取号：TN106/E802
作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、
出版社：New York : M. Dekker, 1977.

Electronic devices and circuits

0
索取号：TN11/E901.2
作者：Bell、 David A.、 1930-、
出版社：Reston, Va. : Reston Pub. Co., 1980.

Solid state electronic devices

0
索取号：TN11/E801
作者：Streetman、 Ben G.、
出版社：Englewood Cliffs, N.J. : Prentice-Hall, [1972]

Optoelectronic devices and principles

0
索取号：TN15/E991
作者：Mooney、 William J.、 1941-、
出版社：Englewood Cliffs, N.J. : Prentice Hall, c1991.

Advanced scanning electron microscopy and X-ray microanalysis

0
索取号：TN153/E901
作者：
出版社：New York : Plenum Press, 1986.

The chemical applications of transmission electron microscopy

0
索取号：TN153/E802
作者：Fryer、 J. R.、
出版社：London ; New York : Academic Press, 1979.

Quantitative scanning electron microscopy

0
索取号：TN153/E801
作者：
出版社：London ; New York : Academic Press, 1974.

Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope

0
索取号：TN153-53/E804/1974
作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、
出版社：Chicago Ill. : IIT Research Institute, 1973.

Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978

0
索取号：TN153-53/E801/10.3
作者：International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、
出版社：West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.

The infrared handbook

0
索取号：TN21-62/E801
作者：Environmental Research Institute of Michigan. Infrared Information and Analysis (IRIA) Center.、Wolfe、 William L.、Zissis、 George John、 1922-、United States. Office of Naval Research.、
出版社：Washington : The Office, 1978.

Physics of semiconductor devices

0
索取号：TN303/E991
作者：Shur、 Michael.、
出版社：Englewood Cliffs, N.J. : Prentice Hall, 1990.

Numerical analysis for semiconductor devices

0
索取号：TN303/E903
作者：Kurata、 Mamoru.、
出版社：Lexington, Mass. : Lexington Books, c1982.

Semiconductor devices and integrated electronics

0
索取号：TN303/E904
作者：Milnes、 A. G. (Arthur George)、 1922-、
出版社：New York : Van Nostrand Reinhold, 1980.